Methods of correction of the second order aberrations
T11N3
Methods of correction of the second order aberrations in laser
time-of-flight analyzers with the axial-symmetric fields
A.A. Sysoev, E.P. Fedoseev, A.V. Karpov, A.M. Mikhailov
A radical method is described to increase resolution of laser TOF mass spectrometers with an axially symmetric electrostatic analyzer more than tenfold. The essence of method consists in get involve into the ion optics of the mass spectrometer of the reflector, which generates a second-order temporal aberration with an opposite polarity with respect to the aberrations in the free drift space of plasma. Due to the compensation of chromatic aberrations of the second order and optimization ion-optical scheme of laser-flight mass spectrometer, as well considering the partial compensation of the third order aberrations resolution of mass spectrometer increases up to (1–2)´104 value. Theoretical calculations justifying the proposed method are presented.
